NIKON A1R CONFOCAL & SUPER RESOLUTION SYSTEM | Research Core Microscopy

Capabilities

Fixed and live sample imaging
Bright-field, phase contrast, and fluorescence imaging
FRET (Fluorescence Resonance Energy Transfer)
FRAP (Fluorescence Recovery After Photobleaching)
Multipoint acquisition, Multichannel acquisition, Large image scan (image stitching), Z-stack, and 2D/3D deconvolution.

Strength of SIM

The lateral resolution of the super resolution system can reach to 85-115nm, and the axial resolution can reach to 270nm. This doubles the resolution of a conventional confocal microscope.

PFS: Perfect Focus System with a 3 mm range to combat focal drift and maintain long term time-lapse focus stability.

Lasers

405nm, 488nm, 561nm, 640nm
AOTF (Acousto-Optical Tunable Filter) installed

Detectors

Transmitted light detector
Two GasApe detectors (for lasers 488 and 561)
Two standard detectors (for lasers 405 and 640)

RCF Nikon Confocal & SIM User Manual

Publications using N-SIM Super Resolution Microscope System 

Nature Protocol for SIM microscopySIM sample preparation guideline

Nikon Confocal and superresolution microscopy e-book (Science/AAAS Publishing group)

Nikon Microscopy Education

Objectives

Obj	Objective	Medium	Use
10x	Plan Apo 10x/0.45NA	Dry	Confocal
20x	Plan Apo VC 20x/0.75NA  DIC	Dry	Confocal
40x	Plan Fluor 40x/1.30NA  DIC	Oil	Confocal
60x	Apo 60x/1.40NA DIC	Oil	Confocal
100x	SR Apo TIRF 100x/1.49NA	Oil	Confocal/SIM

Samples

Confocal optical sectioning is best for samples less than 100 microns thick.

SIM imaging is best for samples less than 20 microns thick
Deconvolution is best for samples no more than 5 microns thick.

Software

Nikon NIS-Elements C software in a Windows 10 operating system